RAS PhysicsПоверхность. Рентгеновские, синхротронные и нейтронные исследования Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques

  • ISSN (Print) 1028-0960
  • ISSN (Online) 3034-5731

Structural Suppression of Blister Formation on the Tungsten Surface under He Implantation with an Energy of 30 keV

PII
S30345731S1028096025040173-1
DOI
10.7868/S3034573125040173
Publication type
Article
Status
Published
Authors
Volume/ Edition
Volume / Issue number 4
Pages
119-126
Abstract
The influence of ultrafine-grained structure and cone-shaped surface morphology on the formation of blisters under irradiation of tungsten with He ions with energy of 30 keV has been studied. In comparative experiments, ultrafine-grained and fine-grained samples with an average grain size of 300 nm and 7 μm, respectively, with smooth and cone-shaped surface morphology were used. The ultrafine-grained structure in tungsten samples was obtained by severe plastic deformation, and the cone-shaped surface morphology was obtained by high-fluence irradiation with Ar ions with the energy of 30 keV. It was found that blisters are formed on both fine-grained and ultrafine-grained samples when irradiated with He ions with a fluence of 10 ion/cm. On the fine-grained samples, some of the blisters were with the lids removed, while in the ultrafine-grained samples, all blisters were intact. The thickness of the lids, diameter of the blisters depends on the grain size. The cone-shaped surface morphology on ultrafine-grained tungsten was found to suppress blister formation.
Keywords
вольфрам гелий аргон интенсивная пластическая деформация ультрамелкозернистая структура ионное облучение блистеры
Date of publication
19.01.2025
Year of publication
2025
Number of purchasers
0
Views
52

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