RAS PhysicsПоверхность. Рентгеновские, синхротронные и нейтронные исследования Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques

  • ISSN (Print) 1028-0960
  • ISSN (Online) 3034-5731

Energy Spectra of Atoms Sputtered by Low-Energy Ions: Computer Simulation

PII
S30345731S1028096025030111-1
DOI
10.7868/S3034573125030111
Publication type
Article
Status
Published
Authors
Volume/ Edition
Volume / Issue number 3
Pages
69-74
Abstract
The energy spectra and average energies of sputtered atoms were calculated for a number of amorphous targets (Si, Ti, Ni, V and Nb) bombarded with 1 keV Ar ions. The calculations were carried out using the computer simulation programs OKSANA and SRIM-2013. It is shown that for targets whose atoms are heavier than incident ions, SRIM can greatly overestimate the contribution of fast sputtered atoms. This is especially noticeable in calculations with the surface binding energy found by adjusting the calculated sputtering yields to the experimental ones. The simulation results are compared with analytical estimates of the average energy of ejected atoms based on the linear theory of sputtering. It is shown that in all the cases considered, these estimates are also greatly overestimated, since they do not take into account the degradation of collision cascades at low bombarding energies. A good agreement of the OKSANA, TRIM.SP and ACAT simulations is noted.
Keywords
ионная бомбардировка распыление энергетические спектры и средние энергии распыленных атомов компьютерное моделирование
Date of publication
15.11.2024
Year of publication
2024
Number of purchasers
0
Views
46

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