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RAS PhysicsПоверхность. Рентгеновские, синхротронные и нейтронные исследования Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques

  • ISSN (Print) 1028-0960
  • ISSN (Online) 3034-5731

Structure and Morphology of the Tungsten-Based Material of the First Wall of the Tokamak Divertor Before and After Irradiation with Hydrogen Plasma

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PII
S30345731S1028096025020133-1
DOI
10.7868/S3034573125020133
Publication type
Article
Status
Published
Authors
D.D. Polyakov
  • Affiliation:
    Ioffe Institute
    Saint Petersburg Electrotechnical University “LETI”
A.V. Voronin
  • Affiliation: Ioffe Institute
A.V. Nashchekin
  • Affiliation: Ioffe Institute
A.A. Levin
  • Affiliation: Ioffe Institute
Volume/ Edition
Volume / Issue number 2
Pages
101-118
Abstract
The results of a study of the microstructure and structure of plates made of tungsten metal powder (group of companies “Specmetalmaster”, GC “SMM”) used as protective tiles in the lower divertor of the tokamak Globus-M and subjected to additional treatment with hydrogen plasma of a coaxial accelerator from distances of 50 and 260 mm at 5, 10 and 20 irradiation cycles are presented. The microstructure and elemental composition of the plate surface were determined by scanning electron microscopy and energy dispersive X-ray spectroscopy, respectively. The microstructure of the irradiated surface layer of the plates at a penetration depth of X-rays up to ~1.4 µm was analyzed from X-ray diffraction data using graphical methods of Williamson-Hall plot and crystallite size - microstrain plot adapted to take into account the observed pseudo-Voigt type of X-ray reflections. The structure of this layer was refined using the Rietveld method. The asymmetry of tungsten (W) reflections after plasma treatment was described by a model with 2 (for samples irradiated from a distance of 260 mm) and 3 (for a distance of 50 mm) crystalline W phases of the same cubic symmetry, but with slightly different parameters of the cubic unit cell and with different values of the mean size of crystallites and the absolute value of mean microstrain in them.
Keywords
рентгеновская дифракция профильный анализ методом графика Вильямсона- Холла профильный анализ методом графика “размер кристаллита-микродеформация” метод Ритвельда растровая электронная микроскопия энергодисперсионная рентгеновская спектроскопия дивертор токамака вольфрам
Date of publication
18.08.2024
Year of publication
2024
Number of purchasers
0
Views
43

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