- PII
- S3034573125090164-1
- DOI
- 10.7868/S3034573125090164
- Publication type
- Article
- Status
- Published
- Authors
- Volume/ Edition
- Volume / Issue number 9
- Pages
- 122-126
- Abstract
- Thin NiO films with thickness from 40 to 170 nm were obtained by pulsed laser deposition on c-AlO substrates using the second harmonic of YAG:Nd- laser for ablation of a metal Ni target in a vacuum chamber at an oxygen pressure of 7.5 mTorr and substrate temperature of 370°C. Using X-ray diffraction, all NiO films were shown to have high crystalline perfection and the [111] orientation. The surface roughness of the obtained films is in the range from 1.6 to 2.3 nm. It was found that with increase in NiO film thickness, the charge carrier concentration decreased and the specific resistance increased. According to measurements of the optical properties of the films, the band gap increases from 3.43 to 3.63 eV with decreasing thickness.
- Keywords
- антиферромагнетики оксид никеля импульсное лазерное осаждение тонкие эпитаксиальные пленки спинтронные устройства
- Date of publication
- 09.04.2025
- Year of publication
- 2025
- Number of purchasers
- 0
- Views
- 4
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